Title: AEHR TEST SYSTEMS is a leading producer of test and burn-in equipment.
Description: AEHR TEST SYSTEMS is a leading producer of test and burn-in equipment. The company develops, manufactures and sells systems that are designed to reduce the cost of testing Dynamic Random Access Memories (DRAMS) and other integrated circuits (ICs), perfor
Keywords:Aehr Test Systems, Aehr Test, Aehr, ATS, DiePak, MAX, MTX, Wafers, WAFER BURN-IN, WAFER LEVEL BURN-IN, Wafer-Level Burn-in, burn-in, parallel test, massively parallel test, TDBI, WLBI, test during burn-in, burn-in board, BIB, BIBs, parallel test board, GD, known-good die, MBT, MTT,
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WaferPak, FOX, MAX4, MAX3, MAX2, ATX, ATX2, environmental test, environmental stress, HALT, HAST, memory test, DRAM test, microprocessor test, logic test, DSP test, digital signal processor test, laser diode burn-in, VCSEL burn-in, accelerated life test, bathtub curve, Arrhenius, Arrhenius Equation, MBI, monitored burn-in, soft errors, alpha particle, wafer probe, full wafer probe, full wafer contact, burn-in socket, KGD socket, burn-in carrier, bare die carrier, bare die burn-in(View Less)
