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Title: ITCN | Defining Synchronized Instrumentation for Embedded Systems
Description: Not available
Keywords:ITCN, Engineering Services, BCIT, bus integrity tester, databus test, embedded system testing, time domain reflectometer, TDR, VME, MIL-STD-1553, VME test, MIL-STD-1750, Embedded System Analyzers, test equipment, test instrumentation, legacy system support, flightline test, military test equipment, bus monitor, system emulators, ARINC, AYK-14, H009, ALE-40, ALE-47,
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